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CP741V-CMPT7410
25V,1A,350mW Bare die,17.720 X 17.720 mils,Transistor-Small Signal (<=1A)
The image for CP741V-CMPT7410
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Please refer to the Device Datasheet for an image of the part case and material composition information.
Documentation Links:
Device Datasheet
Case & Material Composition Datasheet
Item Number Status Description Packaging Base Availability ECCN Code HTS Code Part Marking: Request Samples
CP741V-CMPT7410-CT Active 25V,1A,350mW Bare die,17.720 X 17.720 mils,Transistor-Small Signal (<=1A) WafflePack@400 Please call for Qty
EAR99 8541.21.0040  
CP741V-CMPT7410-WN Active 25V,1A,350mW Bare die,17.720 X 17.720 mils,Transistor-Small Signal (<=1A) Wafer@76,280*</br>*Estimated, die qty will vary based on probing Please call for Qty
EAR99 8541.21.0040  

Please note:
  1. If requesting Tin/Lead plated devices, add the suffix " TIN/LEAD" to the part number when ordering (example: 2N2222A TIN/LEAD).
  2. If requesting Lead (Pb) Free plated devices, add the suffix " PBFREE" to the part number when ordering (example: 2N2222A PBFREE).
A Central sales representative will confirm the availability of the plating type requested.

Additional Documentation Links:
Analytical Test Report:Wafer Transistor
Analytical Test Report:Wafer Schottky
Analytical Test Report:Wafer Switching Diode
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Schottky
Analytical Test Report:Active Device, Rectifier
Analytical Test Report:Wafer/Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Package Detail Document:WAFER
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Rectifier
Analytical Test Report:Wafer MOSFET
Analytical Test Report:TVS Die
Analytical Test Report:Wafer/Die
Analytical Test Report:Die
Analytical Test Report:Die

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Status
Availability

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CMST7410
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CXT7410
25V,1A,1.2W Surface mount Transistor-Small Signal (<=1A) PNP Low VCE(SAT)
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