You are logged in as ::  Guest      Registered user login
manufacturer of innovative discrete semiconductor solutions
Central Semiconductor

CPD35-CMPSH-3
Bare die,15.500 X 15.500 mils,0.2A, 30V Schottky Diode
The image for CPD35-CMPSH-3
is currently unavailable.
Please refer to the Device Datasheet for an image of the part case and material composition information.
Documentation Links:
Device Datasheet
Case & Material Composition Datasheet
Item Number Status Description Packaging Base Availability ECCN Code HTS Code Part Marking: Request Samples
CPD48V-CMPSH-3-CT Active 30V Bare die,13.777 X 13.777 mils,Rectifier-Schottky (>=1A) WafflePack@400 In Stock
 EAR99 8541.10.0040  
CPD48V-CMPSH-3-WN Active 30V Bare die,13.777 X 13.777 mils,Rectifier-Schottky (>=1A) Wafer@41,000*</br>*Estimated, die qty will vary based on probing Please call for Qty
Replaces CPD35-CMPSH-3-WN 		EAR99 8541.10.0040  
CPD35-CMPSH-3-WN Discontinued , Stock Only Bare die,15.500 X 15.500 mils,0.2A, 30V Schottky Diode Wafer@41,000*</br>*Estimated, die qty will vary based on probing In Stock,Replaced by CPD48V-CMPSH-3-WN
Exact Electrical Equivalent, Slight Mechanical Differences 		EAR99 8541.10.0040  

Please note:
  1. If requesting Tin/Lead plated devices, add the suffix " TIN/LEAD" to the part number when ordering (example: 2N2222A TIN/LEAD).
  2. If requesting Lead (Pb) Free plated devices, add the suffix " PBFREE" to the part number when ordering (example: 2N2222A PBFREE).
A Central sales representative will confirm the availability of the plating type requested.

Additional Documentation Links:
Analytical Test Report:Wafer Transistor
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Schottky
Analytical Test Report:Wafer Switching Diode
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Schottky
Analytical Test Report:Wafer Rectifier
Analytical Test Report:Wafer MOSFET
Analytical Test Report:Active Device, Rectifier
Analytical Test Report:TVS Die
Analytical Test Report:Wafer/Die
Analytical Test Report:Wafer/Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Package Detail Document:WAFER
Product EOL Notice:BLANKET PDN-BARE DIE PRODUCTS

Alternate Devices with Different Packaging:
Datasheet
Part Number
Description
Packaging
Package
Details &
Composition
Status
Availability

CMDSH-3 		100mA,30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Active

CMDSH-3G 		100mA,30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Replaced by Halogen Free Version:CMDSH-3

CMHSH-3 		30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Active

CMOSH-3 		30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Active

CMPSH-3 		30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Active

CMSSH-3 		30V Surface mount Diode-Schottky (<1A) Single
Box, Reel
Active

CMXSH-3 		30V Surface mount Diode-Schottky (<1A) Triple
Box, Reel
Active

CPD48V-CMPSH-3 		30V Bare die,13.777 X 13.777 mils,Rectifier-Schottky (>=1A)
WaferForm, WafflePack
Active

  In order to better serve you, we have created a new web based request system.
Click here to access our new inquiry page. Login to the website is required.
First time users please use the quick and easy one time website registration.

For further assistance using the new web based request system, click here.