You are logged in as ::  Guest      Registered user login
manufacturer of innovative discrete semiconductor solutions
Central Semiconductor

CPS041-2N5064
.8A,200V Bare die,41.340 X 41.340 mils,SCR
The image for CPS041-2N5064
is currently unavailable.
Please refer to the Device Datasheet for an image of the part case and material composition information.
Documentation Links:
Device Datasheet
Case & Material Composition Datasheet
Item Number Status Description Packaging Base Availability ECCN Code HTS Code Part Marking: Request Samples
CPS053-2N5064-CT Active .8A,200V Bare die,53.150 X 53.150 mils,SCR WafflePack@400 Please call for Qty
Replaces CPS041-2N5064-CT 		EAR99 8541.30.0040  
CPS053-2N5064-WN Active .8A,200V Bare die,53.150 X 53.150 mils,SCR Wafer@6,474*</br>*Estimated, die qty will vary based on probing Please call for Qty
Replaces CPS041-2N5064-WN 		EAR99 8541.30.0040  
CPS041-2N5064-CT Discontinued , Stock Only .8A,200V Bare die,41.340 X 41.340 mils,SCR WafflePack@400 Replaced by CPS053-2N5064-CT
Exact Electrical Equivalent, Slight Mechanical Differences 		EAR99 8541.30.0040  
CPS041-2N5064-WN Discontinued , Stock Only .8A,200V Bare die,41.340 X 41.340 mils,SCR Wafer@6,474*</br>*Estimated, die qty will vary based on probing Replaced by CPS053-2N5064-WN
Exact Electrical Equivalent, Slight Mechanical Differences 		EAR99 8541.30.0040  

Please note:
  1. If requesting Tin/Lead plated devices, add the suffix " TIN/LEAD" to the part number when ordering (example: 2N2222A TIN/LEAD).
  2. If requesting Lead (Pb) Free plated devices, add the suffix " PBFREE" to the part number when ordering (example: 2N2222A PBFREE).
A Central sales representative will confirm the availability of the plating type requested.

Additional Documentation Links:
Analytical Test Report:Wafer Transistor
Analytical Test Report:Wafer Schottky
Analytical Test Report:Wafer Switching Diode
Analytical Test Report:Die
Analytical Test Report:Die
Package Detail Document:WAFER
Product EOL Notice:CPS041 CHIP PROCESS
Analytical Test Report:Wafer Rectifier
Analytical Test Report:Wafer
Analytical Test Report:TVS Die
Analytical Test Report:Wafer/Die
Analytical Test Report:Die

Alternate Devices with Different Packaging:
Datasheet
Part Number
Description
Packaging
Package
Details &
Composition
Status
Availability

CPS053-2N5064 		.8A,200V Bare die,53.150 X 53.150 mils,SCR
WaferForm, WafflePack
Active

2N5064 		.8A,200V Through-Hole SCR
Box, Ammo, Reel
Active

  In order to better serve you, we have created a new web based request system.
Click here to access our new inquiry page. Login to the website is required.
First time users please use the quick and easy one time website registration.

For further assistance using the new web based request system, click here.